The VK-X Series 3D Laser Scanning Confocal Microscope provides non-contact, nanometer-level profile, roughness, and film thickness data on any material, and indicates which metrics are most critical for evaluation.

Laser scanning microscopes combine both a white light and laser light source to generate a high-resolution color image, as well as collect detailed measurement data from the surface of an object. These systems are basically a hybrid between a compound microscope and optical profilometer or profiler. The laser used for scanning the surface can vary, but is generally an He-Ne gas laser or semiconductor laser. Some laser scanning microscopes use a special optical system, called a "confocal optical system", for removing out-of-focus light and are known as confocal microscopes.

Features:

• Non-contact, high-accuracy surface measurements with 0.5 nm Z-resolution
• High-definition color images on any object with no sample preparation required
• Its compact optical path minimizes beam pathlength and improves spectral performance by limiting the number of beam reflections, which translates into extremely reproducible results with no instrument drift. The spectrometer takes advantage of unique Smart System technology, which automates purge and optical component recognition. Sampling parameters, beam path, spectral range and experiment types are also automatically configured with the Nicolet FT-IR Series